发明名称 Electro microscopy and electro tomography performing method for e.g. three-dimensional mapping of resistance, involves using electrical characteristics of sample to obtain image of sample with specific structural resolution
摘要 <p>The method involves bringing a sample i.e. biological tissue, in contact with a probe, which has an array (105) of a number of probe wires (101) having diameter of less than 10 nanometers in the place of the contact with the sample. Electrical characteristics of the sample between a large number of probe wires are measured and used to obtain two or three dimensional image of the sample with a structural resolution in two dimensions of less than 20 nanometers. The probe wires are fused in proximity of the sample in a non conductive matrix. An independent claim is also included for a device for performing electro microscopy and electro tomography on a sample.</p>
申请公布号 DE102006043118(A1) 申请公布日期 2008.03.27
申请号 DE20061043118 申请日期 2006.09.08
申请人 NOELTING, BENGT 发明人 NOELTING, BENGT
分类号 G01N27/00 主分类号 G01N27/00
代理机构 代理人
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