A method for cleaning a deposition chamber is provided to improve operational efficiency of deposition equipment and to secure a stable process condition by reducing a cleaning process time. A wafer unloading process is performed to unload a wafer from a chamber for performing a deposition process under a predetermined deposition condition(10). A cleaning gas supply process is performed to supply a cleaning gas into the chamber without causing a change of deposition temperature and a change of process atmosphere(20). An excitation process is performed to excite the cleaning gas within the chamber(30). A reactant exhausting process is performed to exhaust a reactant by inducing a reaction between the excited cleaning gas and a deposit within the chamber(40).
申请公布号
KR20080026746(A)
申请公布日期
2008.03.26
申请号
KR20060091691
申请日期
2006.09.21
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
BAE, BYOUNG JAE;PARK, YOUNG LIM;AHN, SANG YOUNB;CHO, SUNG LAE;LEE, JIN IL;PARK, HYE YOUNG;LIM, JI EUN