发明名称 METHOD FOR DETECTING DOT DEFECTS IN FLAT DISPLAY PANEL
摘要 A method for detecting dot defects in a flat display panel is provided to effectively and consistently detect the dot defects through automation and more exactly detect the dot defects by a luminance calibration process. A method for detecting dot defects in a flat display panel includes the steps of: obtaining an image for each color pattern by using an imaging device(102); performing calibration for the obtained image(104); detecting a dot position for at least one of the color patterns(106); and detecting the dot defects by comparing a luminance value of dots with a reference value. The step of detecting the dot defect further includes a step of: measuring luminance by including at least one line of pixels constituting an adjacent dot opposite to a high dot adjacent to a testing dot when the dot adjacent to the testing dot is the high dot.
申请公布号 KR20080026995(A) 申请公布日期 2008.03.26
申请号 KR20060092335 申请日期 2006.09.22
申请人 JOH, YOUNG WHAN 发明人 JEON, HAK JIN;KANG, BYOUNG CHUL;BYUN, DAE KYOON;KIM, TAE HEE;YANG, DONG SOCK
分类号 H04N17/00;G06T5/00 主分类号 H04N17/00
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