发明名称 Scanning particle beam instrument
摘要 A scanning particle beam instrument is provided, the instrument including a scanner, a radiation detector and a DC amplifier, the DC amplifier being operable to amplify a signal generated by the radiation detector to produce a video signal, the instrument further including a controller operable to so direct the beam relative to a specimen, or to determine when the beam is so directed relative to a specimen, that an actual video signal produced by the DC amplifier may be compared with a desired video signal, to compare actual and desired video signals and to adjust a DC offset of the DC amplifier so as to reduce a difference between the signals. Also provided is a method of producing a video signal using such an instrument.
申请公布号 US7348557(B2) 申请公布日期 2008.03.25
申请号 US20050208492 申请日期 2005.08.22
申请人 CARL ZEISS SMT LIMITED 发明人 ARMIT ANDREW PHILIP
分类号 G01J1/20;H01J37/244;H01J37/26;H01J37/28 主分类号 G01J1/20
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