发明名称 |
Test system for integrated circuits |
摘要 |
A test board includes a plurality of sockets for connection to a plurality of integrated circuit chips to be tested. A test control device on the board turns on at least one test engine for testing the plurality of chips simultaneously. A checking circuit verifies the functionality of each chip by comparing outputs of chips with each other or with a golden chip. Failing chips are disconnected from further testing and passing or failing chips are recorded.
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申请公布号 |
US7350108(B1) |
申请公布日期 |
2008.03.25 |
申请号 |
US19990394302 |
申请日期 |
1999.09.10 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
DEAN ALVAR A.;VENTRONE SEBASTIAN T. |
分类号 |
G06F11/00 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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