TEST CONTROL CIRCUIT BLOCKING DIRECT CURRENT PATH IN WAFER LEVEL TEST AND METHOD THEREOF

摘要

A test control circuit for blocking direct current path in a wafer level test and a method thereof are provided to perform the wafer level test efficiently without loss of a voltage applied to a test pad. A test pad(110) applies a test voltage from the outside when a wafer level test for a memory device is performed. An input buffer(120) receives and outputs the test voltage to an internal circuit when the wafer level test is performed. A current blocking part(130) blocks a direct current path from the test pad to a ground voltage in response to a control signal when the wafer level test is performed.