发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device with an insulating film which is excellent in electrical characteristic. SOLUTION: Gas with a noble gas content of 50% or larger and 99% or smaller which contains noble gas, nitrogen, and hydrogen or noble gas and ammonia, and contains no silicon is supplied into a vacuum vessel. Further, a high frequency is supplied into the vacuum vessel from a plate-like slot antenna which is installed in the upper part of the vacuum vessel so as to be opposed to a placement stand in the vacuum vessel and has a plurality of slots. Thereby, the gas in the vacuum vessel is turned to plasma. A silicon nitride film is formed by nitriding the surface of a silicon layer of the substrate by the plasma. Since high density plasma at a low electronic temperature can be generated in this manner, an insulation film with a favorable electric characteristic can be formed. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008066736(A) 申请公布日期 2008.03.21
申请号 JP20070248069 申请日期 2007.09.25
申请人 TOKYO ELECTRON LTD 发明人 HONGO TOSHIAKI
分类号 H01L21/318;H01L21/31;H01L29/78 主分类号 H01L21/318
代理机构 代理人
主权项
地址