发明名称 HANDLER FOR TESTING ELECTRONIC PARTS
摘要 A handler for testing electronic parts is provided to prevent excessive pressure higher than preset pressure from damaging the electronic parts such as a terminal in connecting the electronic part of a test tray and a test socket of a test board. In a handler(100) for testing electronic parts, an exchanging unit(130) receives the electronic parts to be tested and installs the electronic parts in a test tray(T), and discharges the completely tested electronic parts by separating the electronic parts from the test tray. A testing unit(160) tests the electronic parts of the test tray supplied from the exchanging unit and has a test board(163). A connection unit(170) is composed of a pusher pressing the test tray toward the test board while the test tray transferred to the testing unit faces the test board; a pusher driving unit; a pressure sensor sensing pressure applied to the test tray by the pusher; and a connection control unit receiving information detected by the pressure sensor and controlling the pusher driving unit to press the test tray at a preset pressure.
申请公布号 KR100813206(B1) 申请公布日期 2008.03.13
申请号 KR20060091433 申请日期 2006.09.20
申请人 MIRAE CORPORATION 发明人 AHN, JUNG UG;KIM, SUN HWAL;CHOI, WAN HEE;HUR, JUNG
分类号 G01R31/26 主分类号 G01R31/26
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