发明名称 |
HANDLER FOR TESTING ELECTRONIC PARTS |
摘要 |
A handler for testing electronic parts is provided to prevent excessive pressure higher than preset pressure from damaging the electronic parts such as a terminal in connecting the electronic part of a test tray and a test socket of a test board. In a handler(100) for testing electronic parts, an exchanging unit(130) receives the electronic parts to be tested and installs the electronic parts in a test tray(T), and discharges the completely tested electronic parts by separating the electronic parts from the test tray. A testing unit(160) tests the electronic parts of the test tray supplied from the exchanging unit and has a test board(163). A connection unit(170) is composed of a pusher pressing the test tray toward the test board while the test tray transferred to the testing unit faces the test board; a pusher driving unit; a pressure sensor sensing pressure applied to the test tray by the pusher; and a connection control unit receiving information detected by the pressure sensor and controlling the pusher driving unit to press the test tray at a preset pressure.
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申请公布号 |
KR100813206(B1) |
申请公布日期 |
2008.03.13 |
申请号 |
KR20060091433 |
申请日期 |
2006.09.20 |
申请人 |
MIRAE CORPORATION |
发明人 |
AHN, JUNG UG;KIM, SUN HWAL;CHOI, WAN HEE;HUR, JUNG |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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