发明名称 TESTING DEVICE AND TESTING METHOD
摘要 PROBLEM TO BE SOLVED: To shorten the time required for an insulation test. SOLUTION: In each of M electrical tests (in this example, the second test of 3 tests) establishing the condition of ((M-1) < log<SB>2</SB>N≤M (M is an integer)), one side (signal lines 5b and 5f) of signal lines 5b and 5c and signal lines 5f and 5g that are adjacent to each other in a predetermined direction are connected to a pair of conductor patterns are connected to one of high potential and low potential, signal lines 5a and 5e adjacent to the one-side signal lines on the opposite side to the predetermined direction are connected to one of the potentials, the other-side (signal lines 5c and 5g) of the signal lines are connected to the other potential, signal lines 5d and 5h adjacent to the other-side signal lines on the side of the predetermined direction are connected to the other of the high potential and low potential, and the electrical parameter between each of conductor patterns Pa, Pb, Pg and Ph connected to the high potential and each of conductor patterns Pc-Pf connected to the low potential is measured. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008058254(A) 申请公布日期 2008.03.13
申请号 JP20060238539 申请日期 2006.09.04
申请人 HIOKI EE CORP 发明人 YAMAZAKI HIROSHI
分类号 G01R31/02;H05K3/00 主分类号 G01R31/02
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