| 摘要 |
PROBLEM TO BE SOLVED: To enhance reliability while shortening the test time. SOLUTION: The semiconductor integrated circuit comprises a laser fuse circuit (125) for storing a first trimming code by laser irradiation, an electric fuse circuit (126) for storing a second trimming code by voltage application, and a circuit (123) for regulating the potential level or the timing depending on the first or second trimming code. COPYRIGHT: (C)2008,JPO&INPIT
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