发明名称 Substrate processing system, substrate processing method and storage medium
摘要 [Object]To provide a technique capable of avoiding or reducing the adverse influence on the equipment of an atmospheric carrying chamber when a substrate processed by the vacuum process is carried to the atmospheric carrying chamber. [Means for Solving the Problems]In the present invention, a posttreatment chamber for carrying out a posttreatment in an atmospheric atmosphere adjoins a load-lock chamber. Products produced on a substrate are removed by processing the substrate in the posttreatment chamber before the substrate is carried to an atmospheric carrying chamber. A carrying means installed in the said atmospheric carrying chamber caries the substrate to and from the said posttreatment chamber. The said posttreatment chamber and the atmospheric carrying chamber are separated from each other by a partition wall, and the partition wall is provided with an opening having the shape of a slit through which the said carrying means and the substrate can pass. The said carrying means carries the substrate into and out of the posttreatment chamber through the slit.
申请公布号 US2008053957(A1) 申请公布日期 2008.03.06
申请号 US20070892661 申请日期 2007.08.24
申请人 TOKYO ELECTRON LIMITED 发明人 WAKABAYASHI SHINJI
分类号 H01L21/306 主分类号 H01L21/306
代理机构 代理人
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