发明名称 SOURCE MATERIAL COLLECTION UNIT FOR A LASER PRODUCED PLASMA EUV LIGHT SOURCE
摘要 An EUV light source is disclosed which may comprise a laser source generating a laser beam and a source material, e.g. tin, SnBr<SUB>4</SUB>, SnBr<SUB>2</SUB>, SnH<SUB>4</SUB> tin-gallium alloys, tin-indium alloys, tin-indium-gallium alloys or combinations thereof, that is irradiated by the laser beam to form a plasma and emit EUV light. The EUV light source may also comprise a beam dump positioned to receive the laser beam and a system controlling the temperature of the beam dump within a pre¬ selected range. In one embodiment, the source material may be irradiated at an irradiation zone and the source may further comprises a receiving structure formed with a surface shaped to receive source material ejected from the irradiation zone and direct the received source material for subsequent collection. The receiving structure and the beam dump may be formed as a single integrated unit.
申请公布号 WO2008027158(A2) 申请公布日期 2008.03.06
申请号 WO2007US17441 申请日期 2007.08.06
申请人 CYMER, INC.;BYKANOV, ALEXANDER, N.;HANSSON, BJORN 发明人 BYKANOV, ALEXANDER, N.;HANSSON, BJORN
分类号 H05H1/00 主分类号 H05H1/00
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