| 摘要 |
PROBLEM TO BE SOLVED: To analyze even a trace amount of sample with high sensitivity. SOLUTION: Carrier gas is introduced into the first ionization chamber 11 and excited/ionized, and a high-speed current of the excited/ionized carrier gas is formed and jetted into the second ionization chamber 21, and sample gas is introduced into the second ionization chamber 21 by a negative pressure generated by jetting of the high-speed current, and an excitation species or ions included in the carrier gas are applied to the sample gas in the second ionization chamber 21, to thereby generate sample gas ions. The generated sample gas ions are jetted from a nozzle 20A into a mass spectrometer. COPYRIGHT: (C)2008,JPO&INPIT
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