发明名称 Method for manufacturing semiconductor device
摘要 A method for manufacturing a semiconductor device, in forming plugs, an alignment error margin between wirings and lower plugs is increased by using a conductive pad and thus avoids an increase of a contact resistance caused by an alignment error and improves reliability.
申请公布号 US2008057694(A1) 申请公布日期 2008.03.06
申请号 US20060646699 申请日期 2006.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM SANG MIN;JUNG WOO YUNG
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
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