发明名称 |
Aperture variable inspection optical system and color filter evaluaton process |
摘要 |
Disclosed is an aperture variable inspection optical system including a variable aperture unit 13 having a polygonal light transparent section and light collecting systems 12 a, 12 b for forming an irradiation spot U of light passing through the variable aperture unit 13 at the position of a sample S. The variable aperture unit 13 is capable of changing the shape/size of the polygon. The size of the irradiation spot U can be changed without rearranging the aperture unit.
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申请公布号 |
US2008055592(A1) |
申请公布日期 |
2008.03.06 |
申请号 |
US20070896041 |
申请日期 |
2007.08.29 |
申请人 |
OTSUKA ELECTRONICS CO., LTD. |
发明人 |
NAKAMURA KENJI;SHIRAIWA HISASHI |
分类号 |
G01N21/01 |
主分类号 |
G01N21/01 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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