发明名称 Aperture variable inspection optical system and color filter evaluaton process
摘要 Disclosed is an aperture variable inspection optical system including a variable aperture unit 13 having a polygonal light transparent section and light collecting systems 12 a, 12 b for forming an irradiation spot U of light passing through the variable aperture unit 13 at the position of a sample S. The variable aperture unit 13 is capable of changing the shape/size of the polygon. The size of the irradiation spot U can be changed without rearranging the aperture unit.
申请公布号 US2008055592(A1) 申请公布日期 2008.03.06
申请号 US20070896041 申请日期 2007.08.29
申请人 OTSUKA ELECTRONICS CO., LTD. 发明人 NAKAMURA KENJI;SHIRAIWA HISASHI
分类号 G01N21/01 主分类号 G01N21/01
代理机构 代理人
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