发明名称 System and method for device testing
摘要 An electronic device ( 120 ) is provided that comprises: a transceiver circuit ( 310 ) configured to send and receive signals; a memory unit ( 330 ) configured to contain testing, configuration, and calibration (TCC) code ( 440, 450, 460 ) used to define TCC functions in the device, and operational code ( 470 ) used to define operational functions in the device; and a device controller ( 320 ) connected to the transceiver circuit and the memory unit, configured to control the device in an operational mode in accordance with the operational code and operational instructions received via the transceiver circuit ( 650 ), and to control the device in a TCC mode in accordance with the TCC code and TCC instructions received via the transceiver circuit ( 635, 640 ). The device controller is further configured to permanently disable access to at least a portion of the TCC code in response to a disable instruction received via the transceiver circuit ( 645 ).
申请公布号 US2008057874(A1) 申请公布日期 2008.03.06
申请号 US20060513365 申请日期 2006.08.31
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 SHVODIAN WILLIAM M.;BOLL ERIC H.
分类号 H04B17/00 主分类号 H04B17/00
代理机构 代理人
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