发明名称 Polishing composition and polishing method with low content of sodium and acetate ions.
摘要 In a polishing composition, the concentration of one of either sodium ions or acetate ions is 10 ppb or less, or the concentrations of sodium ions and acetate ions are 10 ppb or less. The polishing composition preferably contains a water soluble polymer such as hydroxyethvlcellulose, an alkali such as ammonia, and abrasive grains such as colloidal silica. The polishing composition is mainly used in polishing of the surfaces of semiconductor wafers such as silicon wafers, especially used in finish polishing of the surfaces of such wafers.
申请公布号 GB2441222(A) 申请公布日期 2008.02.27
申请号 GB20070016357 申请日期 2007.08.22
申请人 FUJIMI INCORPORATED 发明人 NAOTO NOGUCHI;KAZUTOSHI KOTAMA;YUTAKA NIWANO
分类号 H01L21/321;B24B37/00;C09G1/02;C09K3/14;H01L21/304 主分类号 H01L21/321
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