发明名称 Method and apparatus for measuring shape of bumps
摘要 The present invention provides a bump shape measuring apparatus comprising an illumination optical system which illuminates bumps arranged on a board with illumination light of a low tilt angle to a surface of the board; a detection optical system where reflected light from the bumps is condensed for detection of image signals of the bumps by a high tilt angle to the surface of the board; an image processing unit where an outline of the tip and the base of each of the bumps is calculated based on the image signals of each of the bumps, and geometric characteristics including at least a position and height of each of the bumps are calculated based on the outline of the tip and the base of each of the bumps; and a main control unit where information on the calculated geometric characteristics of the bumps is displayed on a display unit.
申请公布号 US7336816(B2) 申请公布日期 2008.02.26
申请号 US20040964690 申请日期 2004.10.15
申请人 HITACHI VIA MECHANICS, LTD. 发明人 SASAZAWA HIDEAKI;NOMOTO MINEO;YAMAGA MASATOSHI;IWATA CHIKARA;UEHARA MASASHI
分类号 G01B11/24;G06K9/00;G01B11/06;G06T7/00;H05K3/40;H05K3/46 主分类号 G01B11/24
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