发明名称 MEASUREMENT PROBE OF CONTACT TYPE
摘要 PROBLEM TO BE SOLVED: To provide a measurement probe of contact type capable of being in good contact with the object to be measured without damaging it. SOLUTION: The probe 5 fixed to a vertically driving mechanism and its tip is brought into contact with the electric circuit for transmitting a signal to an electric measuring instrument comprises a tip part 3 of cone shape, and main body of a rod shape 4, wherein the diameter of the bottom of the cone is smaller than the rod main body 4. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008039639(A) 申请公布日期 2008.02.21
申请号 JP20060215872 申请日期 2006.08.08
申请人 HIOKI EE CORP 发明人 TOMOI TADASHI
分类号 G01R1/067;H05K3/34 主分类号 G01R1/067
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