Tie pair configuration test set

摘要

A configuration test set is used for testing a configuration of a tie pair. A first line is configured to connect to a first pin-input of a first connector that connects to the tie pair under test. A second line is configured to connect to a second pin-input of the first connector that connects to the tie pair under test. At least one indicator indicates when voltage is applied to the tie pair under test via the first line and applied to the second line via the tie pair under test.