发明名称 Method for manufacturing a semiconductor substrate and method for manufacturing a semiconductor in which film thicknesses can be accurately controlled
摘要 A method of manufacturing semiconductor substrates. After supporting layers are provided on side walls of grooves formed in a semiconductor substrate, grooves that expose a second semiconductor layer are formed. Etching gas or etching liquid is brought in contact with the first semiconductor layer through the grooves, to form a void portion between the semiconductor substrate 1 and the second semiconductor layer. By thermally oxidizing the semiconductor substrate, the second semiconductor layer and the supporting layers, an oxide film is formed in the void portion between the semiconductor substrate and the second semiconductor layer, an oxide film is formed on side walls of the semiconductor substrate in the grooves, and the supporting layers are changed into oxide films.
申请公布号 US7332399(B2) 申请公布日期 2008.02.19
申请号 US20050127496 申请日期 2005.05.11
申请人 SEIKO EPSON CORPORATION 发明人 KATO JURI
分类号 H01L21/762;H01L21/02;H01L21/20;H01L21/36;H01L21/76;H01L27/12;H01L29/786 主分类号 H01L21/762
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