| 摘要 |
Disclosed is a conductor inspection apparatus capable of detecting a state of an inspection-target electric conductor with a high degree of accuracy in a non-contact manner. The inspection apparatus includes a signal supply section 510 for supplying an inspection signal to an inspection-target conductor 520 , and two sensor plates 570, 580 disposed approximately parallel to each other in the vicinity of the conductor 520 . The inspection apparatus is designed to inspect a configuration of the conductor 520 disposed opposed to the sensor plate 570 , in accordance with a measured signal level from the sensor plate 570 . The inspection apparatus further includes a subtracter 550 for subjecting respective detected signal values from the sensor plates 570, 580 to subtraction, and a divider 560 for dividing the detected signal value from a selected one of the sensor plates by the subtraction result to normalize the detected signal value from the selected sensor plate so as to detect a relative ratio between the detected signal values from the sensor plates to obtain a value X corresponding a distance between the selected sensor plate and the conductor 520 , as a detection result.
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