发明名称 Method for optically trimming electronic components
摘要 Methods for adjusting the bulk material properties of manufactured components, such as resistors, thermistors, varistors, capacitors, resonators, oscillators, and optical components. Adjustment of the resistance of a resistor can be achieved by directing a high energy beam, such as an ultraviolet beam, onto a resistor formed from a matrix component and an embedded conductive component. The high energy beam adjusts the resistivity of the resistor material substantially without ablating the matrix component by affecting the matrix component, the conductive component, or both. Because of the lack of ablation, the material having a property to be adjusted can be a sub-layer in a laminated structure, with the high energy beam being directed through other layers formed thereon.
申请公布号 US7332402(B2) 申请公布日期 2008.02.19
申请号 US20040846210 申请日期 2004.05.14
申请人 FINISAR CORPORATION 发明人 FREEMAN WILLIAM
分类号 H01L21/20;H01C17/065;H01C17/26;H01L21/00;H05K1/16 主分类号 H01L21/20
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