发明名称 High voltage generating circuit and semiconductor memory device having the same
摘要 A high voltage generating circuit and semiconductor memory device having the same are provided, where the high voltage generating circuit includes a pumping driving signal generating means for sequentially generating n-number of pumping driving signals in response to m-number of control signals, where n is greater than m; n-number of pumping control signal generating circuits for generating n-number of pumping control signals in response to the n-number of pumping driving signals, respectively; and n-number of pumping circuits for performing a pumping operation to pump a high voltage level in response to each of the n-number pumping control signals; such that it is possible to reduce a row cycle time regardless of a pumping cycle time, thereby achieving a high speed operation.
申请公布号 US7332955(B2) 申请公布日期 2008.02.19
申请号 US20040026111 申请日期 2004.12.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN CHOONG-SUN
分类号 G11C5/14;H03K3/01;G05F1/10;H02M3/07 主分类号 G11C5/14
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