发明名称 APPARATUS AND METHOD FOR INSPECTING DEFECTS OF DISPLAY DEVICE
摘要 An apparatus and a method for inspecting defects of a display device are provided to obtain images corresponding to plural inspection images through once scan using plural line scan cameras by using plural composite inspection images generated from plural inspection images, thereby significantly reducing an image obtaining time. A stage(310) is mounted with a display device(360) and reciprocates in a predetermined scan direction. Plural line scan cameras(320-1 to 320-n) are spaced from the stage as much as a predetermined distance as having a linear photographing area vertical to the scan direction, and spaced from each other along the scan direction. An inspection pattern generating unit(330) divides each of plural inspection images corresponding to the number of the line scan cameras based on the spaced distance between the line scan cameras, sequentially combines partial images located in a cross direction from an inspection image matrix configured with each of the divided inspection images in order to generate plural composite inspection images, and sequentially outputs each of the composite inspection image to the display device according to a movement amount of the stage. An image processing unit(340) detects defects of the display device based on each of the inspection images that each of the line scan camera obtains from the plural composite inspection images outputted to the display device.
申请公布号 KR100803043(B1) 申请公布日期 2008.02.18
申请号 KR20060098391 申请日期 2006.10.10
申请人 MACRON CO., LTD. 发明人 LEE, KIL JAE
分类号 G02F1/13 主分类号 G02F1/13
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