MEASURING APPARATUS, TESTING APPARATUS, AND ELECTRONIC DEVICE

摘要

A measuring apparatus that measures signal-under-test of which signal level is changed at a predetermined bit time interval is provided. The measuring apparatus includes: a strobe timing generator that sequentially generates strobes arranged at substantially even time intervals; a level comparison section that detects the level of the signal-under-test at a timing at which each strobe is sequentially provided; a capture memory that stores therein the signal level outputted by the level comparison section; and a digital signal processing section that calculates a measurement result of the signal-under-test based on data series including data which have substantially even time intervals and each of which interval is larger than a bit time interval of the signal-under-test. The measuring apparatus may include a logical comparison section that outputs a comparison result indicating whether the logical value detected by the level comparison section is corresponding to an expected value and a memory that stores therein the comparison result outputted by the logical comparison section instead of the capture memory. In this case, the digital signal processing section derives the measurement result of the signal-under-test from the comparison result stored in the memory.