发明名称 Semiconductor memory device and manufacturing method thereof
摘要 A semiconductor memory device includes: a transistor formed in a substrate; a capacitor formed above one of source/drain regions of the transistor; a bit line formed above the substrate and extending in the gate length direction of the transistor; a first conductive plug connecting one of the source/drain regions and the capacitor; a second conductive plug connected to the other source/drain region that is not connected to the first conductive plug; and a third conductive plug formed on the second conductive plug and connected to the bit line. The central axis of the third conductive plug is displaced from the central axis of the second conductive plug in the gate width direction of the transistor.
申请公布号 US2008035975(A1) 申请公布日期 2008.02.14
申请号 US20070826089 申请日期 2007.07.12
申请人 NAKAGAWA RYO;NAKABAYASHI TAKASHI;ARAI HIDEYUKI 发明人 NAKAGAWA RYO;NAKABAYASHI TAKASHI;ARAI HIDEYUKI
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
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