发明名称 Integrated circuit wearout detection
摘要 An integrated circuit is provided with latency detecting circuitry for detecting signal generation latency within one or more functional circuits and in response thereto to generate a wearout response. The wearout response can take a variety of different forms such as reducing the operating frequency, increasing the operating voltage, operating task allocation within a multiprocessor system, manufacturing test binning and other wearout responses.
申请公布号 US2008036487(A1) 申请公布日期 2008.02.14
申请号 US20070878882 申请日期 2007.07.27
申请人 ARM LIMITED;UNIVERSITY OF MICHIGAN 发明人 BRADLEY DARYL WAYNE;BLOME JASON ANDREW;MAHLKE SCOTT
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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