| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a three-dimensional shape measuring apparatus which is not affected by patterns of objects to be measured or disturbance light, and to provide its method. <P>SOLUTION: The apparatus includes a projection means 3 for projecting stripe-pattern light in which high-intensity stripes and low-intensity stripes having lower brightness than that of the high-intensity stripes are alternately arranged to an object to be measured 2; a camera 4 for receiving the reflection of the stripe-pattern light and outputting image data; and a computer 5 for generating three-dimensional coordinate data on the basis of the image data. The computer 5 includes a brightness-difference determination means 50 for determining acceptability as to whether the brightness difference between the high-intensity stripes and the low-intensity stripes at prescribed part in the image data exceeds a prescribed value or not; a brightness adjustment means 51 for creating partially-modified stripe-pattern light in which the brightness of the prescribed part determined as not acceptable is adjusted; a reprojection command means 52 for commanding the projection means 3 to project the partially-modified stripe-pattern light to the object to be measured; and a second-image-reception command means 53 for receiving the reflection of the partially-modified stripe-pattern light and outputting image data. <P>COPYRIGHT: (C)2008,JPO&INPIT |
