| 摘要 |
PROBLEM TO BE SOLVED: To reduce the cost of an image reading apparatus and to reduce a mounting area by eliminating the need of providing a test pattern generating circuit at the post stage of an image reading signal processing IC. SOLUTION: The image reading signal processing IC has an independent signal system for each color to which analog image signals corresponding to three primary colors obtained by reading color image information of a document by a CCD (6). In each of the signal systems, test pattern generating circuits 21R, 21G and 21B are disposed between A/D conversion circuits 15R, 15G and 15B, and LVDS processing circuits 17R, 17G and 17B. Further, an operational mode determination information input means formed of a TG&I/F 18, an OR gate 23, and the like. The operational mode of each of the test pattern generating circuits 21R, 21G and 21B is switched between a normal mode for outputting digital image data output from the A/D conversion circuit and a test pattern output mode for generating and outputting digital data of a test pattern. COPYRIGHT: (C)2008,JPO&INPIT
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