发明名称 X-RAY FLUOROSCOPIC INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an X-ray fluoroscopic inspection apparatus capable of easily bringing a target position of a specimen into view of a fluoroscopic image. SOLUTION: The apparatus includes a moving mechanism 6 for moving the plane of a table 5 arranged between a X-ray source 1 and a X-ray detector 3 to xy-direction, a magnification factor changing means 7 for moving the table 5 toward the X-ray source 1 and the X-ray detector 3, an image synthesizing means 11 for forming one synthesized fluoroscopic image from a fluoroscopic image obtained at a plurality of moving positions at a predetermined magnification factor, a position specifying means 12 for specifying a position on the synthesized fluoroscopic image displayed on a display part 9, and a moving control means 13 for controlling the moving mechanism 6 for the specified position to be put into the fluoroscopic image. For the specimen 4 which cannot be brought in view at a predetermined minimum magnification factor, the synthesized fluoroscopic image is obtained in a desired range including the whole. The desired position is specified on the synthetic fluoroscopic image to easily obtain the fluoroscopic image on which the position can be brought into view. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008032754(A) 申请公布日期 2008.02.14
申请号 JP20070277639 申请日期 2007.10.25
申请人 TOSHIBA IT & CONTROL SYSTEMS CORP 发明人 UYAMA KIICHIRO;HATA HITOSHI;TSURU SHOJI;ICHIMARU YUJI
分类号 G01N23/04 主分类号 G01N23/04
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