发明名称 |
PANEL FOR ANALYSIS AND ANALYSIS DEVICE USING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a panel for analysis capable of preventing contamination and a shortage of sample solution even if the sample solution is attached to a periphery of an inlet. SOLUTION: A chamber with which sample solution spotted to an inlet 14 is transferred is placed inside a panel 3 for analysis. The inlet 14 is formed protruding in a direction separating away from the chamber. A recess 12 is formed around the inlet 14. The inlet 14 is positioned on a panel holding member 101 for analysis of an analysis device on a center of rotation axis side so as to optically access and analyze the chamber by rotating the panel holding member 101 for analysis. COPYRIGHT: (C)2008,JPO&INPIT
|
申请公布号 |
JP2008032695(A) |
申请公布日期 |
2008.02.14 |
申请号 |
JP20070168311 |
申请日期 |
2007.06.27 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
SUGIMOTO HIROBUMI;KITO MASAAKI;MORI MASAKAZU;NINOMIYA SHINICHI;SHINOHARA NORIYUKI;TAKANO HIROSHI |
分类号 |
G01N35/00;G01N35/08 |
主分类号 |
G01N35/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|