发明名称 PANEL FOR ANALYSIS AND ANALYSIS DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a panel for analysis capable of preventing contamination and a shortage of sample solution even if the sample solution is attached to a periphery of an inlet. SOLUTION: A chamber with which sample solution spotted to an inlet 14 is transferred is placed inside a panel 3 for analysis. The inlet 14 is formed protruding in a direction separating away from the chamber. A recess 12 is formed around the inlet 14. The inlet 14 is positioned on a panel holding member 101 for analysis of an analysis device on a center of rotation axis side so as to optically access and analyze the chamber by rotating the panel holding member 101 for analysis. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008032695(A) 申请公布日期 2008.02.14
申请号 JP20070168311 申请日期 2007.06.27
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SUGIMOTO HIROBUMI;KITO MASAAKI;MORI MASAKAZU;NINOMIYA SHINICHI;SHINOHARA NORIYUKI;TAKANO HIROSHI
分类号 G01N35/00;G01N35/08 主分类号 G01N35/00
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