发明名称 Substrate processing apparatus and substrate processing method
摘要 A substrate processing apparatus and a substrate processing method are provided wherein an oxide film which is thinner than the conventional films can be formed with uniform thickness when forming an oxide film on the front-side surface of a substrate. A substrate processing apparatus ( 12 ) for processing a substrate (W) by feeding a processing liquid comprises: a temperature regulator ( 133 ) to regulate the temperature of said processing liquid; and a underplate temperature adjuster ( 115 ) to adjust the temperature of an underplate ( 77 ) which is placed in proximity to the backside surface of said substrate W.
申请公布号 US7329616(B2) 申请公布日期 2008.02.12
申请号 US20060327310 申请日期 2006.01.09
申请人 TOKYO ELECTRON LIMITED 发明人 ORII TAKEHIKO;AMAI MASARU
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
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