发明名称 Semiconductor device and method for fabricating the same
摘要 <p>A semiconductor device having improved capacitance may include a semiconductor substrate, a gate electrode on the semiconductor substrate, a capacitor lower electrode formed of substantially the same material as the gate electrode and being in the same layer as the gate electrode, an interlayer insulating film that covers the gate electrode and capacitor lower electrode, the interlayer insulating film including an opening through which the top surface of the capacitor lower electrode may be exposed, a capacitor upper electrode that fills the opening, and a dielectric film between the capacitor lower electrode and capacitor upper electrode.</p>
申请公布号 KR100801076(B1) 申请公布日期 2008.02.11
申请号 KR20060019466 申请日期 2006.02.28
申请人 发明人
分类号 H01L27/04;H01L27/108 主分类号 H01L27/04
代理机构 代理人
主权项
地址