发明名称 |
A CAPACITOR FOR A SEMICONDUCTOR DEVICE AND THE FABRICATING METHOD THEREOF |
摘要 |
<p>A capacitor of a semiconductor device and a fabricating method thereof are provided to increase capacitance by securing a maximum surface area in a minimum space thereof. A first electrode(101) is formed on an upper surface of a substrate(100). A first insulating layer(103) is formed on the first electrode in order to expose the first electrode partially. A second electrode(105) is formed on the first insulating layer in order to expose the first insulating layer partially. The second electrode has a size smaller than the size of the first insulating layer. A second insulating layer(107) is formed on the exposed first insulating layer and the second electrode in order to expose the second electrode partially. A third electrode(109) is formed on the exposed first electrode and the second insulating layer.</p> |
申请公布号 |
KR100801849(B1) |
申请公布日期 |
2008.02.11 |
申请号 |
KR20060082446 |
申请日期 |
2006.08.29 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
PARK, HYUNG JIN;HWANG, MUN SUB |
分类号 |
H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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