发明名称 A CAPACITOR FOR A SEMICONDUCTOR DEVICE AND THE FABRICATING METHOD THEREOF
摘要 <p>A capacitor of a semiconductor device and a fabricating method thereof are provided to increase capacitance by securing a maximum surface area in a minimum space thereof. A first electrode(101) is formed on an upper surface of a substrate(100). A first insulating layer(103) is formed on the first electrode in order to expose the first electrode partially. A second electrode(105) is formed on the first insulating layer in order to expose the first insulating layer partially. The second electrode has a size smaller than the size of the first insulating layer. A second insulating layer(107) is formed on the exposed first insulating layer and the second electrode in order to expose the second electrode partially. A third electrode(109) is formed on the exposed first electrode and the second insulating layer.</p>
申请公布号 KR100801849(B1) 申请公布日期 2008.02.11
申请号 KR20060082446 申请日期 2006.08.29
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 PARK, HYUNG JIN;HWANG, MUN SUB
分类号 H01L27/108 主分类号 H01L27/108
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