发明名称 SEMICONDUCTOR MEMORY DEVICE, AND ITS MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor memory device which can make use of conventional design environments and requires a reduced manufacturing cost, and to provide its manufacturing method. <P>SOLUTION: The manufacturing method of the semiconductor memory device includes steps of: forming a plurality of trenches 22 on a semiconductor substrate 10; heat-treating the semiconductor substrate in a hydrogen atmosphere, thereby coupling spaces under the plurality of trenches with one another while closing upper apertures of the plurality of trenches; forming a semiconductor layer 26 provided on a cavity 25; etching the semiconductor layer on an element isolation forming region; forming an insulation film 30 on a side face and a bottom face of the semiconductor layer; filling a cavity under the semiconductor layer with an electrode material 31; forming element isolation 32 by forming the insulation film on the electrode material in the element isolation forming region; and forming a memory element MC on the semiconductor layer. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008021727(A) 申请公布日期 2008.01.31
申请号 JP20060190585 申请日期 2006.07.11
申请人 TOSHIBA CORP 发明人 HAMAMOTO TAKESHI
分类号 H01L21/8242;H01L27/108;H01L27/12;H01L29/786 主分类号 H01L21/8242
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