发明名称 SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To vary a write verification range according to relief of a bit line, a use of a memory array, etc. in a nonvolatile memory where a result of write verification can be aggregated to be a small number of bits to be output. <P>SOLUTION: The nonvolatile memory has a memory array (11) provided with two or more nonvolatile memory cells (MC) connected to two or more bit lines BL, two or more one-bit judgment circuits (31) which compares and judges read data of a verification read unit read from the memory array in write verification operation with write data bits of a corresponding write data latch (29) in parallel by bit correspondence, and a judgement aggregation circuit (32) which aggregates judged results of the two or more one-bit judgment circuits. The judgement aggregation circuit can select bits to be aggregated among the judged results of the two or more one-bit judgment circuits. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008021370(A) 申请公布日期 2008.01.31
申请号 JP20060192471 申请日期 2006.07.13
申请人 RENESAS TECHNOLOGY CORP 发明人 IWASE TAKASHI;FUJITO MASAMICHI
分类号 G11C16/02;G11C16/06 主分类号 G11C16/02
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