发明名称 CYLINDRICAL MASK STRUCTURE
摘要 <P>PROBLEM TO BE SOLVED: To provide a seamless mask structure that facilitates designing a continuous pattern including a mixture of small and large images such as dots and solid patterns and that achieves high durability in a cylindrical seamless mask. <P>SOLUTION: The cylindrical mask structure comprises a cylindrical substrate and a mask material, wherein the substrate is substantially transparent to actinic rays and the mask material is laid as seamless on the substrate. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008015085(A) 申请公布日期 2008.01.24
申请号 JP20060184334 申请日期 2006.07.04
申请人 ASAHI KASEI CHEMICALS CORP 发明人 KAWAMOTO TADASHI
分类号 G03F1/00;G03F7/20 主分类号 G03F1/00
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