发明名称 |
Novel polymer, positive resist composition and patterning process using the same |
摘要 |
There is disclosed a polymer comprising: at least, a repeating unit of substitutable hydroxy styrene and a repeating unit of substitutable hydroxy vinylnaphthalene which are represented by the following general formula (1). There can be provided a polymer suitable as a base resin of a positive resist composition, in particular, a chemically amplified positive resist composition that can exhibit higher resolution than conventional positive resist compositions, that provides excellent pattern profiles after being exposed and that exhibits excellent etching resistance; a positive resist composition and a patterning process that use the polymer.
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申请公布号 |
US2008020289(A1) |
申请公布日期 |
2008.01.24 |
申请号 |
US20070808684 |
申请日期 |
2007.06.12 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
HATAKEYAMA JUN;TAKEDA TAKANOBU |
分类号 |
G03F1/00;C08F10/14 |
主分类号 |
G03F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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