发明名称 Novel polymer, positive resist composition and patterning process using the same
摘要 There is disclosed a polymer comprising: at least, a repeating unit of substitutable hydroxy styrene and a repeating unit of substitutable hydroxy vinylnaphthalene which are represented by the following general formula (1). There can be provided a polymer suitable as a base resin of a positive resist composition, in particular, a chemically amplified positive resist composition that can exhibit higher resolution than conventional positive resist compositions, that provides excellent pattern profiles after being exposed and that exhibits excellent etching resistance; a positive resist composition and a patterning process that use the polymer.
申请公布号 US2008020289(A1) 申请公布日期 2008.01.24
申请号 US20070808684 申请日期 2007.06.12
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 HATAKEYAMA JUN;TAKEDA TAKANOBU
分类号 G03F1/00;C08F10/14 主分类号 G03F1/00
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