发明名称 METHOD OF FORMATION OF A DAMASCENE STRUCTURE
摘要 A method in which during the formation of damascene features in a semiconductor structure, a planarization material is added to vias formed in the dielectric to protect the vias during subsequent lithographic processing. The planarization material preferred is a developable photosensitive material which can be exposed and developed to define the damascene features rather than etching as is conventional.
申请公布号 US2008020327(A1) 申请公布日期 2008.01.24
申请号 US20060458499 申请日期 2006.07.19
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 YANG CHIH-CHAO;LI WAI-KIN;LIN YI-HSIUNG
分类号 G03F7/26 主分类号 G03F7/26
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