TEST HANDLER

摘要

A test handler is provided to open an insert arranged on the other partial area by opening inserts arranged on a partial area of a test tray and then moving the test tray. In a test handler(100), a first loading unit is loaded with a number of semiconductor devices. A second loading unit is loaded with a number of semiconductor devices. A pick and place unit transports the semiconductor device of the first loading unit to the second loading unit. The second loading unit repeats transportation and stop by being synchronized with the supply operation of the pick and place unit, in order for the pick and place unit to maintain constant supply position of the semiconductor device.