发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To prevent cleavage of a gallium oxide substrate, when dividing a wafer that includes the gallium oxide substrate indicating cleaving property in two directions into individual element. <P>SOLUTION: The gallium oxide substrate 2 with a semiconductor layer formed thereon is divided into strips along a first cleavage surface (m) of the substrate (first dividing step) for forming a bar 20, and then the bar 20 is separated in a direction that is perpendicular to the first cleavage surface (m) (second dividing step). <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008016694(A) 申请公布日期 2008.01.24
申请号 JP20060187478 申请日期 2006.07.07
申请人 TOYODA GOSEI CO LTD;KOHA CO LTD 发明人 IKEMOTO YOSHIHEI;AOKI KAZUO;UJIIE TAKEKAZU
分类号 H01L21/301;B28D5/00;H01L33/06;H01L33/32;H01S5/323 主分类号 H01L21/301
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