摘要 |
<p>Reflectance is measured conveniently even for a color shifted painting color. First reflectance R(a<SUB>a</SUB>) of first reflected light V<SUB>a</SUB> in an incident plane A is measured, and first locus l of the end point of a first vector H<SUB>a</SUB>(|H<SUB>a</SUB>|=|R(a<SUB>a</SUB>)|) divided equally into two and displacing two-dimensionally in the incident plane A is determined. Second reflectance R(a<SUB>b</SUB>) of second reflected light V<SUB>b</SUB> on the outside of the incident plane A is measured, and second locus m of the end point of a second vector H<SUB>b</SUB>(|H<SUB>b</SUB>|=| R(a<SUB>b</SUB>)|) divided equally into two and displacing three-dimensionally on the outside of the incident plane A is determined. Locus n(x, y, z<SUB>i</SUB>) of the end point of a vector H<SUB>i</SUB> divided equally into two on a plane z=z<SUB>i</SUB> parallel with a plane under measurement is approximated from both loci l and m by a mathematical expression representing an ellipse and a modelled approximation model expression is determined. Finally, overall locus n'(x, y, z) of the entire end points of the vector H' of reflected light V' other than the first reflected light V<SUB>a</SUB> and the second reflected light V<SUB>b</SUB> divided equally into two is determined approximately.</p> |