发明名称 LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
摘要 A lithographic apparatus and a device manufacturing method are provided to remove a zeroth non-diffracted order of a patterned beam of a radiation beam by having a filter. A method for transferring an image of a pattern onto a substrate with a lithographic apparatus includes the steps of: selecting a plurality of parameters including a pupil filter parameter; calculating an image of the pattern for the selected parameters; calculating a metric to represent a change of a property of the calculated image over a process range; and based on a result of the metric, (a) adjusting the pupil filter diameter, (b) calculating the image of the pattern, and (c) calculating the metric until a substantially minimum or a maximum value of the change of property is obtained.
申请公布号 KR20080007297(A) 申请公布日期 2008.01.18
申请号 KR20070130770 申请日期 2007.12.14
申请人 ASML NETHERLANDS B.V. 发明人 CHEN ALEK CHI HENG;HANSEN STEVEN GEORGE
分类号 H01L21/027 主分类号 H01L21/027
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