| 摘要 |
The invention relates to an apparatus ( 1 ) for determining surface properties, comprising at least a first radiation device ( 3 ) which emits radiation onto a surface ( 8 ) to be analysed, at least a first radiation detector device ( 5 ) which receives at least part of the radiation emitted by the at least one radiation device ( 3 ) and then scattered and/or reflected by the surface ( 8 ) and outputs at least a first measurement signal which is characteristic of the reflected and/or scattered radiation, and at least a further radiation detector device ( 7 ) which receives at least part of the radiation emitted by the at least one radiation device ( 3 ) and then scattered and/or reflected by a surface ( 8 ) and outputs at least a second measurement signal which is characteristic of the reflected and/or scattered radiation. According to the invention, the first radiation detector device ( 5 ) is offset by a first predefined angle beta 1 with respect to the direction of the radiation reflected by the surface, and the further radiation detector device ( 7 ) is offset by a further predefined angle beta 1 with respect to the direction of the radiation reflected by the surface, and the angles beta 1 and beta 2 are essentially equal and opposite to one another with respect to the direction of the radiation reflected by the surface.
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