发明名称 SEMICONDUCTOR DEVICE HAVING A SALICIDE LAYER AND METHOD OF FABRICATING THE SAME
摘要 A semiconductor device having a salicide layer and a method for fabricating the same are provided to lower the electrical resistance of a wiring by patching a disconnected part of the salicide layer with a metal or a metal silicide. An active region(51) is defined on a semiconductor substrate. A gate electrode crosses an upper surface of the active region. A plurality of spacer patterns(54) are formed on both sidewalls of the gate electrode. A gate salicide layer(56g) is formed on an upper surface of the gate electrode and is partially disconnected. Source/drain salicide layers(56s,56d) are formed on the active region of both sides of the gate electrode. A conductive patch layer(60) is formed on the gate electrode of the disconnected part of the gate salicide layer. The conductive patch layer is plated by using an electroless-plating method. The conductive patch layer is electrically connected to the gate salicide layer.
申请公布号 KR20080006807(A) 申请公布日期 2008.01.17
申请号 KR20060066000 申请日期 2006.07.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, EUN JI;YUN, JONG HO;KIM, DAE YONG;KIM, HYUN SU;KIM, BYUNG HEE;LEE, EUN OK
分类号 H01L21/24;H01L21/336 主分类号 H01L21/24
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