| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit testing apparatus capable of shortening the writing time of format data and improving throughput and provide its method. SOLUTION: The semiconductor integrated circuit testing apparatus provided with both a storage means which is provided correspondingly to pins of a device under test and which stores format data for specifying the waveform of test signals to be provided for the pins and a test signal generating means for generating test signals through the use of the format data is provided with both a data output means constituted of a number of bits smaller than the number of the pins of the device under test for outputting format data in which each bit is related to any pin and a bit selection means for selectively outputting format data of bits related to any pin of the device under test in format data, outputted from the data output means, to the storage means corresponding to any pin. COPYRIGHT: (C)2008,JPO&INPIT
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