发明名称 METHOD OF DRYING A SUBSTRATE AND APPARATUS FOR PERFORMING THE SAME
摘要 A method for drying a semiconductor substrate and an apparatus for performing the same are provided to prevent the leaning effect of a capacitor caused by surface tension of water in a Marangoni dryer. A dipping process is performed to dip a semiconductor substrate into a receptacle with alcohol of a liquid state(S100). A moisture removal process is performed to remove moisture from the semiconductor substrate by removing relatively the alcohol with respect to the substrate dipped into the alcohol of the receptacle(S110). An alcohol removal process is performed to remove the remaining alcohol by dipping the substrate into an organic solvent including fluorine(S120). The alcohol includes isopropyl alcohol.
申请公布号 KR20080006861(A) 申请公布日期 2008.01.17
申请号 KR20060066143 申请日期 2006.07.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 OH, JUNG MIN;HAN, JEONG NAM;HONG, CHANG KI;LEE, KUN TACK;KIM, YOUNG OK
分类号 H01L21/304 主分类号 H01L21/304
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