发明名称 MEMORY MODULE TEST SYSTEM USING SERVER SYSTEM
摘要 A system for mounting and testing a memory module is provided to reduce a test time by mounting a plurality of memory modules to a plurality of test slots at the same time, and test a fast UDIMM(Unbuffered Double In-line Memory Module) by using an RDIMM(Registered Double In-Line Memory Module) or FBDIMM(Fully Buffered Double In-Line Memory Module) server system. A motherboard(31) is equipped with at least one module socket(SL1-A,SL1-B,SL2-A,SL2-B). A test board(33) is equipped with at least one test socket for receiving a memory module in a mounting test. A connecting unit connects the motherboard and the test board electrically. A PLL(Phase Locked Loop)/register(35) is mounted on the test board to correct property of signals. The connecting unit includes interface sockets(36,37) arranged to one side of the test board, and interface boards(38,39) inserted between the interface socket and the module socket. The connecting unit is at least one of a connector, an FPCB(Flexible Printed Circuit Board), and a conductive iron core. The module socket supports an RDIMM interface and the test socket supports a UDIMM interface.
申请公布号 KR20080006749(A) 申请公布日期 2008.01.17
申请号 KR20060065868 申请日期 2006.07.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JUNG KUK;HAN, YOU KEUN;SHIN, HUI CHONG
分类号 G06F11/28 主分类号 G06F11/28
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