发明名称 |
MEMORY UNIT TEST |
摘要 |
<p>The invention relates to a method and device for operating and/or testing memory units, which make it possible to conduct a time-saving test of semiconductor memories during running operation. The inventive method for testing memory units having storage locations provides that, for the storage locations, a first item of test information is formed according to a variable parameter assigned to the respective storage location and according to the contents of the respective storage location.</p> |
申请公布号 |
EP1444700(B1) |
申请公布日期 |
2008.01.16 |
申请号 |
EP20020779192 |
申请日期 |
2002.10.30 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
MERCHANT, KAMAL;MAYER, FRANK |
分类号 |
G11C29/00;G06F11/10;G06F11/22 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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